A scanning electron microscope (SEM) scans a focused electron beam over the surface of a sample to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.
The FEI standard Environmental SEM (ESEM) capability delivers the extra power to accommodate difficult to handle samples and applications. The FEI ESEM provides for in situ, dynamic experiments, that cover many possibilities for materials research and examination: 1) image hydrated sample, 2) crystallization or phase transformation during humidity or thermal cycling, 3) particles in suspension or self-assembly process, and 4) corrosion in metals, to name only a few.
The FEI ESEM’s versatility is well-suited for materials science and characterization. It is equally adept at performing conventional high-resolution SEM imaging/analysis and dynamic in-situ experiments. The FEI ESEM allows for the widest range of samples in their natural state for the most accurate information about structure and composition. The FEI environmental scanning electron microscope features three modes (high vacuum, low vacuum, and ESEM (nitrogen or H2O) to accommodate the widest range of samples of any SEM system. The FEI system is equipped with an energy dispersive x-ray spectrometer for added elemental characterization.